Event focus will be user benefits and use cases of advanced EPC custom commands
Sirit Inc. ("Sirit") (TSX: SI), a leading provider of radio frequency identification ("RFID") technology and NXP Semiconductors ("NXP"), the independent semiconductor company founded by Philips and a leading supplier of RFID chips, today announced they will jointly host an open Webcast on Thursday, January 17, 2008 at 11:00 a.m. EST (5:00 p.m. CET) entitled, "Capturing the Value of Gen 2 Custom Commands".
The Webcast will focus on use cases and the many benefits of the custom commands featured in NXP's G2X integrated circuits (ICs) and supported by Sirit's INfinity 510 Gen 2 reader. Presenters will include Ralf Kodritsch, marketing manager, UCODE RFID products for NXP, along with Tony Sabetti, vice president, RF Solutions for Sirit. The two companies recently announced Sirit's INfinity 510 as the first EPC Gen 2 certified reader to support custom commands featured in NXP's G2X ICs.
These advanced features have been implemented to support the demands of customers who are implementing RFID solutions that go far beyond simple compliance tagging. Custom commands provide additional functionality that many end users from various markets outside of the retail supply chain have sought. By bringing added value to an RFID implementation, the new features allow users to achieve a return on investment more quickly.
Features presented in the open Webcast will include Electronic Article Surveillance (increases theft protection), Read Protect (prevents unauthorized reading of tags and provides enhanced privacy), Calibrate (simplifies the reading and evaluation of tags) and Extended User Memory (expands data storage beyond the EPC number). Additionally, Sirit will introduce planned enhancements scheduled for the new firmware release for its INfinity 510 UHF reader.
Registration for the free Webcast is available at www.sirit.com. Participants will receive a white paper with additional details about the use and application of custom commands, along with a free copy of ODIN technologies' European RFID Reader Benchmark(TM) test report.
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